Objavljeni radovi:
[1]
I. Knežević, M. Obrenović, Z. Rajović, B. Iričanin, P. Osmokrović, Simulation of Ion beam Irradiation effects in perovskite oxide memristors, Trans Tech Publications, Advanced Materials Research, 2014, Vol.906,pp.89-95, DOI: 10.4028/www.scientific.net/AMR.906.89. ISSN: 10226680.
[2]
M. Obrenović, Đ. Lazarević, E. Dolićanin, M. Vujisić, Effects of Ion Beam on the Flash Memory Cells, Nuclear Technology & Radiation Protection, 2014, Vol. 29, No. 2, pp. 116-122, DOI: 10.2298/NTRP14021160 ISSN:1451-3994 (if:0.560)
[3]
D. Nikolić, A. Vasić-Milovanović, M. Obrenović, E. Dolićanin, Effects of succesive Gamma and Neutron Irradiation on Solar Cells, Journal of Optoelectronic and Advanced materials, Vol. 17, No. 3-4, March- April 2015, p.351-365 ISSN: 14544164, (if:0.383)
[4]
M. Obrenović, A. J. Janićijević, D. Arbutina, Statistical Review of the Insulation Capacity of Geiger Muller Counter, Nuclear Technology & Radiation Protection, 2018, Vol XXXIII, No 4,pp.369-374, DOI:10.2298/NTRP1809130090. ISSN:1451-3994 (if:0.614)
[5]
M. Obrenovic, Milić M. Pejovic, Đorđe R. Lazarevic, Nenad M. Kartalovic, Effects induced by Gamma-ray responsible for threshold voltage shift of commercial p-channel power VDMOSFETs, Nuclear Technology & Radiation Protection, 2018,Vol.33, No.1, pp. 81-86, DOI:10.2298/NTRP18010810. ISSN:1451-3994 (if:0.614)
[6]
M. Obrenovic, Đ. Lazarevic, Srboljub J. Stankovic, Nenad M. Kartalovic, The impact of radiation on the characteristics of the semiconductor monocrystalline germanium, Nuclear Technology & Radiation Protection, 2016, Vol. 31, No. 1, pp. 97-101, DOI: 10.2298/NTRP1601097O. ISSN:1451-3994 (if:0.620)
[7]
M. Srećković, S. Ostojić, J. Ilić, Z. Fidanovski, S. Jevtić, D. Knežević, and M. Obrenović, Photoinduced processes, Radiation Interaction with Material and Damages- Material, Nuclear Technology & Radiation Protection, 2015, Vol. 30, No. 1, pp. 23-34, DOI: 10.2298/NTRP1501023S. ISSN:1451-3994 (if:0.372)
[8]
Đ. Lazarević, M. Obrenović, I. Fetahović, P. Osmokrović, Comparison of obtained empirical variance and the mean values of Normally alocated populations Nuclear counting, Nuclear Technology & Radiation Protection, 2014, Year 2014, Vol. 29, No. 4, pp. 285-288, DOI: 10.2298/NTRP1404285L. ISSN:1451-3994 (if:0.560)
[9]
D. Nikolić, A. Vasić, D. Lazarević, M. Obrenović, Improvement Possibilities of the I-V Characteristics of PIN Photodiodes Damaged by Gamma Irradiation, Nuclear Technology & Radiation Protection, 2013, Vol. 28, No. 1, pp. 84-91, DOI: 10.2298/NTRP1301084N. ISSN:1451-3994 (if: 1.000)
[10]
I. Knežević, N. Zdjelarević, M. Obrenović, M. Vujisić, Absorbed Dose assessment in Particle-Beam Irradiated Metal-oxide and Metal-nonmetal memristors, Nuclear Technology & Radiation Protection, 2012, Vol. 27, No.3, pp. 290-296, DOI: 10.2298/NTRP1203290K, ISSN:1451-3994 (if:1.000)
